- Abstract:
- The KEK Accelerator test facility (ATF) extraction line laser-wire system has been upgraded last year allowing the measurement of micron scale transverse size electron beams. The last measurements using the upgraded system from recent operation at the ATF are presented, demonstrating raw measurements of order 3μm RMS. The main component contributions to this measurement are also discussed. © 2010 Elsevier B.V. All rights reserved.
- Publication status:
- Published
- Publisher copy:
- 10.1016/j.nima.2010.03.071
-
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- Volume:
- 623
- Issue:
- 1
- Pages:
- 564-566
- Publication date:
- 2010-11-01
- DOI:
- ISSN:
-
0168-9002
- URN:
-
uuid:6a11e0d3-99ab-4a79-b152-21c30e987d46
- Source identifiers:
-
103720
- Local pid:
- pubs:103720
- Keywords:
- Copyright date:
- 2010
Conference
Micron size laser-wire system at the ATF extraction line, recent results and ATF-II upgrade
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