Journal article
Novel Scanning Probe Concepts for Nanoscale Electrical Characterization
- Abstract:
-
There is a significant need for nanoscale electrical characterization of materials. However, unreliable tip apexes have severely hampered the usage of scanning probe techniques for nanoscale electrical characterization. Encapsulated conductive probes with conductive cores comprising of Platinum Silicide and an insulating encapsulation are powerful tools for electrical characterization of materials at the nanoscale. These probes are significantly wear resistant owing to their large tip-sample ...
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- Publication status:
- Published
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Bibliographic Details
- Journal:
- 2009 9TH IEEE CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO)
- Pages:
- 72-74
- Publication date:
- 2009-01-01
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
pubs:410824
- UUID:
-
uuid:68675820-d66e-414d-93cc-0edf31ada9fa
- Local pid:
- pubs:410824
- Source identifiers:
-
410824
- Deposit date:
- 2013-11-16
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- Copyright date:
- 2009
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