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Novel Scanning Probe Concepts for Nanoscale Electrical Characterization

Abstract:

There is a significant need for nanoscale electrical characterization of materials. However, unreliable tip apexes have severely hampered the usage of scanning probe techniques for nanoscale electrical characterization. Encapsulated conductive probes with conductive cores comprising of Platinum Silicide and an insulating encapsulation are powerful tools for electrical characterization of materials at the nanoscale. These probes are significantly wear resistant owing to their large tip-sample ...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
2009 9TH IEEE CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO) More from this journal
Pages:
72-74
Publication date:
2009-01-01
Language:
English
Keywords:
Pubs id:
pubs:410824
UUID:
uuid:68675820-d66e-414d-93cc-0edf31ada9fa
Local pid:
pubs:410824
Source identifiers:
410824
Deposit date:
2013-11-16

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