Journal article icon

Journal article

The structure of rare earth thin films: holmium and gadolinium on yttrium

Abstract:

Single-crystal holmium and gadolinium layers have been grown on yttrium substrates using the molecular beam epitaxy technique and their structures investigated using high resolution x-ray scattering. The experiments were performed using a Philips MRD diffractometer in Oxford, and with the XMaS facility at the ESRF. Holmium layers with a thickness below Tc′ = 115 Å give scattering that is characteristic of a pseudomorphic film structure with the same in-plane lattice parameter as the yttrium s...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1088/0953-8984/15/43/002

Authors


Journal:
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume:
15
Issue:
43
Pages:
7155-7174
Publication date:
2003-11-05
DOI:
EISSN:
1361-648X
ISSN:
0953-8984
URN:
uuid:680987fe-d4a4-43bd-a91a-d0ca402c596a
Source identifiers:
202666
Local pid:
pubs:202666
Language:
English

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP