Journal article
EFTEM assistant: A tool to understand the limitations of EFTEM
- Abstract:
-
The first version of a free tool for Gatan's Digital Micrograph™ is presented which aims to aid the energy-filtered TEM (EFTEM) community by predicting and correcting the most common sources of degradation. The software allows selection of either Krivanek's or Egerton's approach to account for the spatial resolution degradation caused by the electron optical aberrations. The effects of aberrations and signal 'delocalization' are combined to simulate the blurring caused in EFTEM elemental maps...
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Bibliographic Details
- Journal:
- Ultramicroscopy
- Volume:
- 107
- Issue:
- 4-5
- Pages:
- 313-321
- Publication date:
- 2007-04-01
- DOI:
- ISSN:
-
0304-3991
Item Description
- Pubs id:
-
pubs:178495
- UUID:
-
uuid:67ddd4f3-f4f7-44da-8b72-d6e5fbfcc15e
- Local pid:
- pubs:178495
- Source identifiers:
-
178495
- Deposit date:
- 2012-12-19
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- Copyright date:
- 2007
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