Conference item icon

Conference item

Overview: recent progress in three-dimensional atom probe instruments and applications.

Abstract:

Over the last few years there have been significant developments in the field of three-dimensional atom probe (3DAP) analysis. This article reviews some of the technical compromises that have led to different instrument designs and the recent improvements in performance. An instrument has now been developed, based around a novel reflectron configuration combining both energy compensation and focusing elements, that yields a large field of view and very high mass resolution. The use of laser p...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1017/S143192760707095X

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada More from this journal
Volume:
13
Issue:
6
Pages:
408-417
Publication date:
2007-12-01
Event title:
2nd Australian Workshop on Atom Probe Tomography
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Keywords:
Pubs id:
pubs:10612
UUID:
uuid:672f725c-ee52-4801-8637-525e34a85121
Local pid:
pubs:10612
Source identifiers:
10612
Deposit date:
2012-12-19

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP