Conference item
Advanced strain analysis by high energy synchrotron X-ray diffraction
- Abstract:
-
Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution, and used for the validation of numerical models of deformation. The present paper describes the use of monochromatic and white beam configurations at ESRF, Grenoble and SRS, Daresbury to study prob...
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- Publication status:
- Published
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Bibliographic Details
- Host title:
- ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES
- Volume:
- 404-7
- Pages:
- 329-334
- Publication date:
- 2002-01-01
- ISSN:
-
0255-5476
- ISBN:
- 0878499008
Item Description
- Keywords:
- Pubs id:
-
pubs:63144
- UUID:
-
uuid:671045a2-8f97-4541-b43f-a4defa0bb349
- Local pid:
- pubs:63144
- Source identifiers:
-
63144
- Deposit date:
- 2012-12-19
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- Copyright date:
- 2002
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