Conference item
TEM investigations of Si ion-implanted GaN
- Publication status:
- Published
Actions
Authors
Bibliographic Details
- Journal:
- ELECTRON MICROSCOPY 1998, VOL 3
- Pages:
- 481-482
- Publication date:
- 1998-01-01
- Event title:
- 14th International Congress on Electron Microscopy
- Source identifiers:
-
24394
- ISBN:
- 0750305665
Item Description
- Pubs id:
-
pubs:24394
- UUID:
-
uuid:656f9e0c-b4ec-4866-b08d-c648531806c3
- Local pid:
- pubs:24394
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1998
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