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Conference item

TEM investigations of Si ion-implanted GaN

Publication status:
Published

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Journal:
ELECTRON MICROSCOPY 1998, VOL 3
Pages:
481-482
Publication date:
1998-01-01
Event title:
14th International Congress on Electron Microscopy
Source identifiers:
24394
ISBN:
0750305665
Pubs id:
pubs:24394
UUID:
uuid:656f9e0c-b4ec-4866-b08d-c648531806c3
Local pid:
pubs:24394
Deposit date:
2012-12-19

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