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Conference item

How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification

Abstract:

Recording HAADF STEM data on an absolute scale for image quantification is becoming increasingly common. A particular challenge with this method is that most image simulation programs model the detector as being circularly symmetric and exhibiting uniform detection sensitivity across its entire active region. For a real detector this is rarely the case; it then becomes vital to understand how far one's detector deviates from the ideal. Here we investigate a collection of detector maps recorde...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Publisher:
Institute of Physics Publishing
Volume:
522
Issue:
1
Pages:
012018-012018
Host title:
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)
Publication date:
2014-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Source identifiers:
474132
Pubs id:
pubs:474132
UUID:
uuid:64923a04-6b96-41c6-9c2b-570ab4c8eac5
Local pid:
pubs:474132
Deposit date:
2014-10-13

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