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Microstructural characterisation of transparent barrier layers on polyethylene terephthalate.

Abstract:

Thin transparent SiOx layers deposited on polyester substrates have been characterised using a variety of analytical techniques in order to correlate the microstructure with the barrier performance. For barrier layers free of macro-scale defects a structural model as been proposed that describes the SiOx layer as a dense network with a pore size distribution of 2.7 to 4 Angstrom. In films adversely affected by macroscopic cracks, a new theoretical model has been shown to account accurately fo...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
TWELFTH INTERNATIONAL CONFERENCE ON VACUUM WEB COATING CONFERENCE, PROCEEDINGS OF More from this journal
Pages:
195-203
Publication date:
1998-01-01
Event title:
12th International Vacuum Web Coating Conference
ISBN:
0939997223
Pubs id:
pubs:19961
UUID:
uuid:61f41d3b-9135-40a4-a768-cee7badeb208
Local pid:
pubs:19961
Source identifiers:
19961
Deposit date:
2012-12-19

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