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Conference item

THEORETICAL INVESTIGATIONS OF COMBINED CL AND EBIC MEASUREMENTS ON CRYSTAL DEFECTS

Publication status:
Published

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Journal:
STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS 1989
Volume:
104
Pages:
221-226
Publication date:
1989-01-01
Event title:
6TH INTERNATIONAL SYMP ON THE STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS
Source identifiers:
16134
ISBN:
0854980601
Keywords:
Pubs id:
pubs:16134
UUID:
uuid:5f63db29-12e5-4b7d-940d-fe5a8f56c867
Local pid:
pubs:16134
Deposit date:
2012-12-19

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