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Observation of K-Shell Soft X Ray Emission of Nitrogen Irradiated by XUV-Free Electron Laser FLASH at Intensities Greater than 10(16) W/cm(2)

Abstract:

In the past few years, the development of light sources of the 4th generation, namely XUV/X-ray Free Electron Lasers provides to the scientific community outstanding tools to investigate matter under extreme conditions never obtained in laboratories so far. As theory is at its infancy, the analysis of matter via the self-emission of the target is of central importance. The characterization of such dense matter is possible if photons can escape the medium. As the absorption of K-shell X-ray tr...

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Publication status:
Published

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Publisher copy:
10.1002/ctpp.201000045

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Journal:
CONTRIBUTIONS TO PLASMA PHYSICS
Volume:
51
Issue:
2-3
Pages:
284-287
Publication date:
2011-03-05
DOI:
EISSN:
1521-3986
ISSN:
0863-1042
URN:
uuid:5c2fa6a6-a1e1-445d-881c-ce60ad19cbc5
Source identifiers:
151733
Local pid:
pubs:151733

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