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Journal article

Characterization of Polycrystalline Materials Using Synchrotron X-ray Imaging and Diffraction Techniques

Abstract:

The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propagation based phase contrast imaging, a 3-D imaging mode exploiting the coherence properties of third generation synchrotron beams. Furthermore, for some classes of polycrystalline materials, one may...

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Publication status:
Published

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Publisher copy:
10.1007/s11837-010-0176-6

Authors


Reischig, P More by this author
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Journal:
JOM
Volume:
62
Issue:
12
Pages:
22-28
Publication date:
2010-12-05
DOI:
EISSN:
1543-1851
ISSN:
1047-4838
URN:
uuid:59a6d917-03b0-4692-88e2-148d961a888a
Source identifiers:
177456
Local pid:
pubs:177456
Language:
English

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