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Journal article

Identifying and correcting scan noise and drift in the scanning transmission electron microscope.

Abstract:

The aberration-corrected scanning transmission electron microscope has great sensitivity to environmental or instrumental disturbances such as acoustic, mechanical, or electromagnetic interference. This interference can introduce distortions to the images recorded and degrade both signal noise and resolution performance. In addition, sample or stage drift can cause the images to appear warped and leads to unreliable lattice parameters being exhibited. Here a detailed study of the sources, nat...

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Publication status:
Published

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Publisher copy:
10.1017/s1431927613001402

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
19
Issue:
4
Pages:
1050-1060
Publication date:
2013-08-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:595f56f0-c34e-4f4c-ad90-db738182f588
Source identifiers:
401036
Local pid:
pubs:401036

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