Journal article icon

Journal article

Progress in aberration-corrected scanning transmission electron microscopy.

Abstract:

A new corrector of spherical aberration (C(S)) for a dedicated scanning transmission electron microscope (STEM) is described and its results are presented. The corrector uses strong octupoles and increases C(C) by only 0.2 mm relative to the uncorrected microscope. Its overall stability is greatly improved compared to our previous design. It has achieved a point-to-point resolution of 1.23 A in high-angle annular dark field images at 100 kV. It has also increased the current available in a 1....

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1093/jmicro/50.3.177

Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
Journal of electron microscopy
Volume:
50
Issue:
3
Pages:
177-185
Publication date:
2001-01-01
DOI:
EISSN:
1477-9986
ISSN:
0022-0744
URN:
uuid:5932dfb8-2a53-49af-8f33-bee82f587977
Source identifiers:
4327
Local pid:
pubs:4327

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP