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Processing APT spectral backgrounds for improved quantification

Abstract:

We describe a method to estimate background noise in atom probe tomography (APT) mass spectra and to use this information to enhance both background correction and quantification. Our approach is mathematically general in form for any detector exhibiting Poisson noise with a fixed data acquisition time window, at voltages varying through the experiment. We show that this accurately estimates the background observed in real experiments. The method requires, as a minimum, the z-coordinate and m...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1017/S1431927620024290

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
New College
Role:
Author
ORCID:
0000-0001-9308-2620
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
ORCID:
0000-0002-9256-0966
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
26
Issue:
5
Pages:
964-977
Publication date:
2020-08-19
Acceptance date:
2020-07-27
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Pubs id:
1122270
Local pid:
pubs:1122270

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