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Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction

Abstract:

The deformation around a 500-nm deep Berkovich indent in a large grained Fe sample has been studied using high resolution electron back scatter diffraction (EBSD). EBSD patterns were obtained in a two-dimensional map around the indent on the free surface. A cross-correlation-based analysis of small shifts in many sub-regions of the EBSD patterns was used to determine the variation of elastic strain and lattice rotations across the map at a sensitivity of ∼±10-4. Elastic strains were smaller t...

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Publication status:
Published

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Publisher copy:
10.1080/14786430903304145

Authors


Wilkinson, AJ More by this author
Randman, D More by this author
Journal:
PHILOSOPHICAL MAGAZINE
Volume:
90
Issue:
9
Pages:
1159-1177
Publication date:
2010
DOI:
EISSN:
1478-6443
ISSN:
1478-6435
URN:
uuid:56fa320f-c709-40e4-8c29-48833cfa7d5f
Source identifiers:
54713
Local pid:
pubs:54713

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