Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films (Acta Materialia, 2016)

(untitled) - Wilkinson, A; Vilalta-Clemente, A; Naresh-Kumar, G; Nouf-Allehiani, M; Gamarra, P; di Forte-Poisson, M; Trager-Cowan, C