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Data for On the c-Si/SiO2 interface recombination parameters from photo-conductance decay measurements

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Department:
Materials
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Creator

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Department:
Materials
Role:
Researcher
Publisher:
University of Oxford
Publication date:
2017
DOI:
Format:
Digital
Documentation:
Raw data embedded in Matlab figure files for surface recombination simulations, photo-conductance decay effective lifetime measurements, and Kelvin Probe surface potential.

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