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A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.

Abstract:
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of approximately 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Titchmarsh, JM More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
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Journal:
Ultramicroscopy
Volume:
103
Issue:
1
Pages:
7-15
Publication date:
2005-04-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:4dea024b-cccf-42ef-81c1-5b3e246bd551
Source identifiers:
30291
Local pid:
pubs:30291
Language:
English
Keywords:

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