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Exact MAP states and expectations from perfect sampling: Greig, Porteous and Seheult revisited

Publication status:: Published

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APA Style

Fox, C., & Nicholls, G. (2001). Exact MAP states and expectations from perfect sampling: Greig, Porteous and Seheult revisited. BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING, PT 2, 568, 252–263.

MLA Style

Fox, C., and G. Nicholls. “Exact MAP States and Expectations from Perfect Sampling: Greig, Porteous and Seheult Revisited.” BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING, PT 2, vol. 568, 2001, pp. 252–63.

Chicago Style

Fox, C, and G Nicholls. 2001. “Exact MAP States and Expectations from Perfect Sampling: Greig, Porteous and Seheult Revisited.” In BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING, PT 2, 568:252–63.
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Authors

+ Fox, C More by this author

Role:: Author

+ Nicholls, G More by this author

Role:: Author

Host title:: BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING, PT 2
Volume:: 568
Pages:: 252-263
Publication date:: 2001-01-01
ISSN:: 0094-243X
ISBN:: 0735400040

Pubs id:: pubs:107283
UUID:: uuid:4c6c0af9-0914-4a20-9ae9-fbee22fe423f
Local pid:: pubs:107283
Source identifiers:: 107283
Deposit date:: 2012-12-19

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Copyright date:: 2001

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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