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Imaging modes for direct electron detection in TEM with column parallel CCD

Abstract:

Electron imaging detectors have become the main limiting factor in transmission electron microscopy (TEM). A transition is now being made from indirect scintillator-coupled cameras to directly exposed detectors, which propose imaging modes that are novel in TEM. This work uses a dataset recoded with a directly exposed column parallel charge-coupled-device (CCD) to characterize modulation transfer and detective quantum efficiency of integrating, binary and counting imaging modes. Results prese...

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Publication status:
Published

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Publisher copy:
10.1016/j.nima.2009.03.105

Authors


Moldovan, G More by this author
Jeffery, B More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Particle Physics, REF-Physics
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Volume:
607
Issue:
1
Pages:
13-16
Publication date:
2009-08-01
DOI:
ISSN:
0168-9002
URN:
uuid:4b7dcd47-0dfa-4b87-96c4-cffec33a9103
Source identifiers:
22334
Local pid:
pubs:22334

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