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Structural characterization of interfaces in epitaxial Fe/MgO/Fe magnetic tunnel junctions by transmission electron microscopy

Abstract:

We present a detailed structural characterization of the interfaces in Fe/MgO/Fe layers grown by molecular-beam epitaxy using aberration-corrected transmission electron microscopy (TEM), scanning TEM, and electron energy-loss spectroscopy. When fabricated into magnetic tunnel junctions, these epitaxial devices exhibit large tunnel magnetoresistance ratios (e.g., 318% at 10 K), though still considerably lower than the values predicted theoretically. The reason for this discrepancy is being deb...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.82.024428

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Journal:
PHYSICAL REVIEW B
Volume:
82
Issue:
2
Publication date:
2010-07-28
DOI:
EISSN:
1550-235X
ISSN:
1098-0121
URN:
uuid:48888114-cbdb-438e-b9a9-2c2341e87da9
Source identifiers:
66202
Local pid:
pubs:66202
Language:
English

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