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A comparison of the column approximation and the Howie-Basinski approach in simulations of TEM images under weak-beam diffraction conditions

Abstract:
Weak-beam diffraction contrast images of dislocation loops have been simulated by solving numerically the Howie-Basinski equations, which avoid the column approximation. Quantitative comparisons are made with similar simulations which do make use of the column approximation. The images predicted by the Howie-Basinski equations were displaced relative to images calculated using the column approximation, and were generally broader and somewhat lower in intensity. The differences between the images were most marked for very small loops.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ELECTRON MICROSCOPY AND ANALYSIS 2003
Issue:
179
Pages:
203-206
Publication date:
2004-01-01
Event title:
Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:
0951-3248
Source identifiers:
18662
ISBN:
0750309679
Keywords:
Pubs id:
pubs:18662
UUID:
uuid:4769eedb-faa6-459b-94a8-e52c90c2e4bc
Local pid:
pubs:18662
Deposit date:
2012-12-19

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