- Abstract:
-
We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns from single crystal silicon; high quality dynamical simulations using Bloch wave theory; quantitative measurements of the detector Modulation Transfer Function (MTF) and a numerical model. We have...
Expand abstract - Publication status:
- Published
- Publisher copy:
- 10.1016/j.ultramic.2013.08.005
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- Journal:
- Ultramicroscopy
- Volume:
- 135
- Pages:
- 126-135
- Publication date:
- 2013-12-05
- DOI:
- EISSN:
-
1879-2723
- ISSN:
-
0304-3991
- URN:
-
uuid:46b3b2af-d184-46a5-bdc8-4bc32ac0cb42
- Source identifiers:
-
429190
- Local pid:
- pubs:429190
- Copyright date:
- 2013
Journal article
Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
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