Journal article icon

Journal article

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.

Abstract:

We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns from single crystal silicon; high quality dynamical simulations using Bloch wave theory; quantitative measurements of the detector Modulation Transfer Function (MTF) and a numerical model. We have...

Expand abstract
Publication status:
Published

Actions


Access Document


Authors


Expand authors...
Journal:
Ultramicroscopy
Volume:
135
Pages:
126-135
Publication date:
2013-12-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:46b3b2af-d184-46a5-bdc8-4bc32ac0cb42
Source identifiers:
429190
Local pid:
pubs:429190

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP