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Synchrotron radiation studies of inorganic-organic semiconductor interfaces

Abstract:

Organic semiconductors (polymers and small molecules) are widely used in electronic and optoelectronic technologies. Many devices are based on multilayer structures where interfaces play a central role in device performance and where inorganic semiconductor models are inadequate. Synchrotron radiation techniques such as photoelectron spectroscopy (PES), near-edge X-ray absorption fine structure (NEXAFS) and X-ray standing wave spectroscopy (XSW) provide a powerful means of probing the structu...

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Publication status:
Published

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Journal:
NUCLEAR INSTRUMENTS and METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume:
199
Pages:
475-480
Publication date:
2003-01-05
DOI:
ISSN:
0168-583X
URN:
uuid:45cf9b23-ef04-41b2-9f70-fc30ced456be
Source identifiers:
252315
Local pid:
pubs:252315
Language:
English

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