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Intergranular films in Si3N4 studied by TEM

Abstract:

Like many ceramic materials, Si3N4 contains amorphous intergranular films (IGFs). These films affect or even dominate the properties of the ceramic material. As a result of the sintering process the amorphous IGFs in Si3N4 ceramics contain oxides of silicon and other elements. These additional elements are also observed in amorphous pockets where three or more grains meet. To obtain information about the local atomic structure of the IGFs we employ electron diffraction with a convergent probe...

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Publication status:
Published

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Journal:
ELECTRON MICROSCOPY AND ANALYSIS 2003
Issue:
179
Pages:
401-404
Publication date:
2004-01-01
Event title:
Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:
0951-3248
Source identifiers:
20777
ISBN:
0750309679
Pubs id:
pubs:20777
UUID:
uuid:43fa8c99-a448-43bb-b61a-6f149fa7dedd
Local pid:
pubs:20777
Deposit date:
2012-12-19

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