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Three-dimensional atom probe studies of metallic multilayers

Abstract:

Multilayer film structures which exhibit giant magnetoresistance have applications in the areas of magnetic recording and computer memory. The magnetic properties of these structures are highly dependent upon atomic level structural and compositional variations. Thus. structural characterization with extremely high spatial resolution, especially at the interfaces, is very important in order to optimize the performance of these devices with respect to processing and operating conditions. Field...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Volume:
47
Issue:
15-16
Pages:
4019-4024
Publication date:
1999-11-12
DOI:
ISSN:
1359-6454
URN:
uuid:418809a8-963c-4366-a929-4d809828face
Source identifiers:
5574
Local pid:
pubs:5574

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