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Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.

Abstract:
The technique of energy selected electron diffraction gives information about amorphous structures which can be used to characterize amorphous materials in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonable models consistent with the diffraction data.
Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
McKenzie, DR More by this author
McBride, W More by this author
Goringe, C More by this author
McCulloch, D More by this author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
6
Issue:
4
Pages:
329-334
Publication date:
2000-07-05
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:406953b6-4f0f-4681-8e58-df3f52640a69
Source identifiers:
9409
Local pid:
pubs:9409

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