Journal article icon

Journal article

Atomic resolution imaging of nanoscale chemical expansion in PrxCe1-xO2-δ during in situ heating

Abstract:

Thin film non-stoichiometric oxides enable many high temperature applications including solid oxide fuel cells, actuators, and catalysis. Large concentrations of point defects (particularly, oxygen vacancies) enable fast ionic conductivity or gas exchange kinetics in these materials, but also manifest as coupling between lattice volume and chemical composition. This chemical expansion may be either detrimental or useful, especially in thin film devices that may exhibit enhanced performance th...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted manuscript

Actions


Access Document


Files:
Publisher copy:
10.1021/acsnano.7b07732

Authors


Swallow, JG More by this author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Defferriere, T More by this author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Expand authors...
More from this funder
Funding agency for:
Warner, JH
Publisher:
American Chemical Society Publisher's website
Journal:
ACS Nano Journal website
Volume:
12
Issue:
2
Pages:
1359-1372
Publication date:
2018-01-16
Acceptance date:
2018-01-16
DOI:
EISSN:
1936-086X
ISSN:
1936-0851
Pubs id:
pubs:821541
URN:
uri:403a8e73-38c9-4583-aa30-8737a5abd9f3
UUID:
uuid:403a8e73-38c9-4583-aa30-8737a5abd9f3
Local pid:
pubs:821541

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP