Adaptive finite element simulation of currents at microelectrodes to a guaranteed accuracy. Theory

Journal article

In our accompanying paper (K. Harriman et al., Electrochem. Commun. 2 (2000) 150) we demonstrated how, for the finite element method, an automatic mesh-adaptation algorithm can be derived, given an a posteriori error bound on the simulated current. In this paper we give the technical details of the background theory of the finite element method, and the derivation of the a posteriori error bound. (C)2000 Elsevier Science S.A.

Authors: Harriman, K; Gavaghan, D; Houston, P; Suli, E

• Publication status: Published
• Journal: ELECTROCHEMISTRY COMMUNICATIONS
• Volume: 2
• Issue: 3
• Pages: 157-162
• Publication date: 2000-03-01
• DOI: 10.1016/S1388-2481(99)00160-5
• ISSN: 1388-2481
• Language: English
• Keywords: microelectrode; simulation; finite element method; edge effect