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Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

Abstract:
Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
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Journal:
SPRINGER SERIES CHEM
Volume:
66
Pages:
281-283
Publication date:
2001-01-01
Event title:
12th International Conference on Ultrafast Phenomena
Source identifiers:
29288
Keywords:
Pubs id:
pubs:29288
UUID:
uuid:3df533b6-154b-43aa-988e-c16bf8b9afc7
Local pid:
pubs:29288
Deposit date:
2013-02-20

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