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Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

Abstract:
Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.

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Sokolowski-Tinten, K More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Atomic and Laser Physics, REF-Physics
Siders, CW More by this author
Brown, FLH More by this author
Leitner, DM More by this author
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Volume:
66
Pages:
281-283
Publication date:
2001
URN:
uuid:3df533b6-154b-43aa-988e-c16bf8b9afc7
Source identifiers:
29288
Local pid:
pubs:29288
Keywords:

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