Journal article
Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
- Abstract:
-
We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM prov...
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- Publication status:
- Published
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Bibliographic Details
- Journal:
- APPLIED PHYSICS LETTERS
- Volume:
- 101
- Issue:
- 25
- Pages:
- 253108-253108
- Publication date:
- 2012-12-17
- DOI:
- ISSN:
-
0003-6951
- Source identifiers:
-
377594
Item Description
- Language:
- English
- Pubs id:
-
pubs:377594
- UUID:
-
uuid:3c9fd4ec-8770-43fd-9939-58b174e9b9da
- Local pid:
- pubs:377594
- Deposit date:
- 2013-11-17
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- Copyright date:
- 2012
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