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Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Abstract:

We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM prov...

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Publication status:
Published

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Publisher copy:
10.1063/1.4772514

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
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Journal:
APPLIED PHYSICS LETTERS
Volume:
101
Issue:
25
Pages:
253108-253108
Publication date:
2012-12-17
DOI:
ISSN:
0003-6951
URN:
uuid:3c9fd4ec-8770-43fd-9939-58b174e9b9da
Source identifiers:
377594
Local pid:
pubs:377594
Language:
English

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