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Measuring phonon dephasing with ultrafast pulses using Raman spectral interference

Abstract:

A technique to measure the decoherence time of optical phonons in a solid is presented. Phonons are excited with a pair of time-delayed 80 fs near infrared pulses via spontaneous transient Raman scattering. The spectral fringe visibility of the resulting Raman pulse pair, as a function of time delay, is used to measure the phonon dephasing time. The method avoids the need to use either narrow band or few femtosecond pulses and is useful for low phonon excitations. The dephasing time of phonon...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.78.155201

Authors


Waldermann, FC More by this author
Sussman, BJ More by this author
Lorenz, VO More by this author
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Journal:
PHYSICAL REVIEW B
Volume:
78
Issue:
15
Publication date:
2008-10-05
DOI:
EISSN:
1550-235X
ISSN:
1098-0121
URN:
uuid:3bf5ac37-4b38-435b-839c-e8914690291e
Source identifiers:
3888
Local pid:
pubs:3888
Language:
English

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