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Effect of amorphous layers on the interpretation of restored exit waves

Abstract:

The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of {001} SrTiO₃ with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, th...

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Publication status:
Published
Peer review status:
Peer reviewed

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Institution:
University of Antwerp, Belgium
Department:
Electron Microscopy for Materials Science (EMAT)
More by this author
Institution:
University of Oxford
Department:
Mathematical,Physical & Life Sciences Division - Materials
More by this author
Institution:
University of Antwerp, Belgium
Department:
Electron Microscopy for Materials Science (EMAT)
More by this author
Institution:
University of Oxford
Department:
Mathematical,Physical & Life Sciences Division - Materials
More by this author
Institution:
University of Antwerp, Belgium
Department:
Electron Microscopy for Materials Science (EMAT)
Engineering and Physical Sciences Research Council More from this funder
European Union More from this funder
Publisher:
Elsevier Publisher's website
Journal:
Ultramicroscopy Journal website
Volume:
109
Issue:
3
Pages:
237-246
Publication date:
2009-02-05
DOI:
ISSN:
0304-3991
URN:
uuid:3a2a42c6-3c25-4e75-a3c3-5a84a32458ad
Local pid:
ora:3313

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