Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-angstrom emitter localization.
- Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
- Publication status:
- Peer review status:
- Peer reviewed
- Publisher's version
- Copyright holder:
- Wiley-VCH Verlag
- Copyright date:
- © 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim. This is the publisher's version of the article. The final version is available online from Wiley-VCH Verlag at: [10.1002/adma.201203033]
Views and Downloads
If you are the owner of this record, you can report an update to it here: Report update to this record