Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-angstrom emitter localization.
- Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
- Publication status:
- Peer review status:
- Peer reviewed
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+ Engineering and Physical Sciences Research Council More from this funder
Funding agency for:
Quantum Information Processing IRC (grant ref GR/S82176/01
- Copyright holder:
- Wiley-VCH Verlag
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- © 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim. This is the publisher's version of the article. The final version is available online from Wiley-VCH Verlag at: [10.1002/adma.201203033]
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