Journal article
Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-angstrom emitter localization.
- Abstract:
- Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Version of record, pdf, 917.0KB, Terms of use)
-
- Publisher copy:
- 10.1002/adma.201203033
Authors
Funding
+ Hewlett Packard Ltd
More from this funder
Funding agency for:
Smith, J
Grant:
Quantum Information Processing IRC (grant ref GR/S82176/01
+ Engineering and Physical Sciences Research Council
More from this funder
Funding agency for:
Smith, J
Grant:
Quantum Information Processing IRC (grant ref GR/S82176/01
Bibliographic Details
- Publisher:
- Wiley
- Journal:
- Advanced Materials More from this journal
- Volume:
- 24
- Issue:
- 44
- Pages:
- OP309-OP313
- Publication date:
- 2012-09-12
- DOI:
- EISSN:
-
1521-4095
- ISSN:
-
0935-9648
Item Description
- Language:
-
English
- Keywords:
- Pubs id:
-
pubs:366845
- UUID:
-
uuid:3a024078-31b4-4546-a6a0-e5ee96bfc317
- Local pid:
-
pubs:366845
- Source identifiers:
-
366845
- Deposit date:
-
2013-11-16
Terms of use
- Copyright holder:
- Wiley-VCH Verlag
- Copyright date:
- 2012
- Notes:
- © 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim. This is the publisher's version of the article. The final version is available online from Wiley-VCH Verlag at: [10.1002/adma.201203033]
Metrics
If you are the owner of this record, you can report an update to it here: Report update to this record