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Journal article

Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-angstrom emitter localization.

Abstract:
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1002/adma.201203033

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Institution:
University of Oxford
Division:
MSD
Department:
Physiology Anatomy & Genetics
Role:
Author
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Funding agency for:
Smith, J
Grant:
Quantum Information Processing IRC (grant ref GR/S82176/01
More from this funder
Funding agency for:
Smith, J
Grant:
Quantum Information Processing IRC (grant ref GR/S82176/01
Publisher:
Wiley Publisher's website
Journal:
Advanced Materials Journal website
Volume:
24
Issue:
44
Pages:
OP309-OP313
Publication date:
2012-09-12
DOI:
EISSN:
1521-4095
ISSN:
0935-9648
Source identifiers:
366845
Language:
English
Keywords:
Pubs id:
pubs:366845
UUID:
uuid:3a024078-31b4-4546-a6a0-e5ee96bfc317
Local pid:
pubs:366845
Deposit date:
2013-11-16

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