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Journal article

Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-angstrom emitter localization.

Abstract:
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1002/adma.201203033

Authors


Wildanger, D More by this author
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Institution:
University of Oxford
Department:
Oxford, MSD, Physiology Anatomy and Genetics
Marseglia, L More by this author
Hadden, JP More by this author
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Funding agency for:
Smith, JM
Publisher:
Wiley-VCH Verlag Publisher's website
Journal:
Advanced Materials Journal website
Volume:
24
Issue:
44
Pages:
OP309-OP313
Publication date:
2012-09-12
DOI:
EISSN:
1521-4095
ISSN:
0935-9648
URN:
uuid:3a024078-31b4-4546-a6a0-e5ee96bfc317
Source identifiers:
366845
Local pid:
pubs:366845
Language:
English
Keywords:

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