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Conference item

An elevated temperature STM study of the Si(001) c(4x4) surface reconstruction

Publication status:
Published

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Issue:
164
Pages:
637-640
Host title:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS
Publication date:
1999-01-01
ISSN:
0951-3248
Source identifiers:
174541
ISBN:
0750306505
Pubs id:
pubs:174541
UUID:
uuid:398d729a-639c-4f65-b9b2-704a6bf5a29b
Local pid:
pubs:174541
Deposit date:
2012-12-19

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