Conference item
An elevated temperature STM study of the Si(001) c(4x4) surface reconstruction
- Publication status:
- Published
Actions
Authors
Bibliographic Details
- Issue:
- 164
- Pages:
- 637-640
- Host title:
- MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS
- Publication date:
- 1999-01-01
- ISSN:
-
0951-3248
- Source identifiers:
-
174541
- ISBN:
- 0750306505
Item Description
- Pubs id:
-
pubs:174541
- UUID:
-
uuid:398d729a-639c-4f65-b9b2-704a6bf5a29b
- Local pid:
- pubs:174541
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1999
If you are the owner of this record, you can report an update to it here: Report update to this record