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Stability and spectroscopy of single nitrogen dopants in graphene at elevated temperatures

Abstract:

Single nitrogen (N) dopants in graphene are investigated using atomic-resolution scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS). Using an in situ heating holder at 500°C provided us with clean graphene surfaces, and we demonstrate that isolated N substitutional atoms remain localized and stable in the graphene lattice even during local sp2 bond reconstruction. The high stability of isolated N dopants enabled us to acquire 2D EELS maps w...

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Publisher copy:
10.1021/nn5054798

Authors


Publisher:
American Chemical Society
Journal:
ACS Nano
Volume:
8
Issue:
11
Pages:
11806-11815
Publication date:
2014-11-25
DOI:
EISSN:
1936-086X
ISSN:
1936-0851
URN:
uuid:31a31e56-3691-4b56-9ea3-2808f43e8ba8
Source identifiers:
492741
Local pid:
pubs:492741
Language:
English
Keywords:

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