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Exciton dissociation in polymer field-effect transistors studied using terahertz spectroscopy

Abstract:

We have used terahertz time-domain spectroscopy to investigate photoinduced charge generation in conjugated polymer field-effect transistors. Our measurements show that excitons dissociate in the accumulation layer under the application of a gate voltage, with a quantum efficiency of ∼0.1 for an average gate field of ∼1× 108 V m-1. The transistor history is found to affect the exciton dissociation efficiency, which decreases as holes are increasingly trapped in the accumulation layer. The qua...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.77.125203

Authors


Lloyd-Hughes, J More by this author
Richards, T More by this author
Sirringhaus, H More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Physics, Condensed Matter Physics
Journal:
PHYSICAL REVIEW B
Volume:
77
Issue:
12
Publication date:
2008-03-05
DOI:
EISSN:
1550-235X
ISSN:
1098-0121
URN:
uuid:30520793-b662-4c9c-9632-561d20ba86c9
Source identifiers:
14525
Local pid:
pubs:14525
Language:
English

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