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In situ transmission electron microscopy and ion irradiation of ferritic materials.

Abstract:

The intermediate voltage electron microscope-tandem user facility in the Electron Microscopy Center at Argonne National Laboratory is described. The primary purpose of this facility is electron microscopy with in situ ion irradiation at controlled sample temperatures. To illustrate its capabilities and advantages a few results of two outside user projects are presented. The motion of dislocation loops formed during ion irradiation is illustrated in video data that reveals a striking reduction...

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Publication status:
Published

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Publisher copy:
10.1002/jemt.20670

Authors


Birtcher, RC More by this author
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Journal:
Microscopy research and technique
Volume:
72
Issue:
3
Pages:
182-186
Publication date:
2009-03-05
DOI:
EISSN:
1097-0029
ISSN:
1059-910X
URN:
uuid:2f7ed0a5-a99c-4291-a483-0124304f4106
Source identifiers:
6303
Local pid:
pubs:6303

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