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ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES

Abstract:

Positive-sensitive detection has been combined with time-of-flight mass spectrometry in the atom probe field-ion microscope to yield a system in which both chemical identity and spatial information are obtained for individual ions field evaporated from the specimen surface. This allows the variations in composition originally present in the sample to be reconstructed in three dimensions with subnanometer resolution. From these data, selected region analyses are easily performed, permitting th...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
GROVENOR, C More by this author
HETHERINGTON, M More by this author
SHOLLOCK, B More by this author
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Journal:
MATERIALS CHARACTERIZATION
Volume:
25
Issue:
1
Pages:
143-156
Publication date:
1990-07-05
DOI:
ISSN:
1044-5803
URN:
uuid:2f218de1-ec5c-4347-b5d2-1fa697373145
Source identifiers:
947
Local pid:
pubs:947
Language:
English

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