Journal article
High-precision atomic-scale strain mapping of nanoparticles from STEM images
- Abstract:
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Strain is a crucial factor that influences the physicochemical properties of nanoparticles. Being able to precisely measure strain is important in understanding the intrinsic mechanism of the enhanced performance of nanoparticles. Techniques that have been developed for strain analysis using scanning transmission electron microscopy (STEM) images can be categorized into diffraction-based method and imaging-based method. Here, using image simulation techniques, it is found that the measured tw...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Version of record, 19.1MB, Terms of use)
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- Publisher copy:
- 10.1016/j.ultramic.2022.113561
Authors
Bibliographic Details
- Publisher:
- Elsevier
- Journal:
- Ultramicroscopy More from this journal
- Volume:
- 239
- Article number:
- 113561
- Publication date:
- 2022-05-22
- Acceptance date:
- 2022-05-21
- DOI:
- EISSN:
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1879-2723
- ISSN:
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0304-3991
- Pmid:
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35640478
Item Description
- Language:
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English
- Keywords:
- Pubs id:
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1263203
- Local pid:
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pubs:1263203
- Deposit date:
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2022-07-13
Terms of use
- Copyright holder:
- Luo et al
- Copyright date:
- 2022
- Rights statement:
- © 2022 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
- Licence:
- CC Attribution (CC BY)
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