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Atomic resolution STM of the NiO(001) surface structure and defect sites: c(2x2) patterning and effects of covalent bonding

Abstract:

Elevated temperature STM has been used to obtain atomic resolution images of flat regions, defect sites and step edges on the (001) surface of crystalline nickel oxide. Identification of surface lattice sites seen in empty and filled states (nickel and oxygen sites, respectively) is consistent with recent theoretical results according to which NiO is a charge transfer insulator with strongly correlated electrons. It has been found that certain surface defects lead to the formation of spatiall...

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Publication status:
Published

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Publisher copy:
10.1142/S0218625X97001188

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Dudarev, SL More by this author
Wincott, PL More by this author
Condon, NG More by this author
Muggelberg, C More by this author
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Volume:
4
Issue:
5
Pages:
1003-1008
Publication date:
1997-10-05
DOI:
EISSN:
1793-6667
ISSN:
0218-625X
URN:
uuid:2c0d5a34-02fe-4150-94db-157685f4a2fa
Source identifiers:
11517
Local pid:
pubs:11517

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