Conference icon

Conference

Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm

Abstract:
We report on measurements of a saturated single frequency Ne-like Ge XUV laser on the J = 0->1 transition at 19.6 nm from a refraction compensating double target driven by 150 J of energy from 75 ps Nd-laser pulses. The 19.6 nm line completely dominated the laser output. The output energy was measured to be 0.9 mJ, corresponding to a conversion efficiency of 6x10(-6).
Publication status:
Published

Actions


Authors


Warwick, PJ More by this author
Wolfrum, E More by this author
Expand authors...
Issue:
151
Pages:
56-58
Publication date:
1996
ISSN:
0951-3248
URN:
uuid:2ad4eae6-3e27-47ce-b070-e151cf1b4b26
Source identifiers:
31128
Local pid:
pubs:31128
ISBN:
0-7503-0406-5
Keywords:

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP