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RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS

Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
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Journal:
FIFTY-SECOND ANNUAL MEETING - MICROSCOPY SOCIETY OF AMERICA/TWENTY-NINTH ANNUAL MEETING - MICROBEAM ANALYSIS SOCIETY, PROCEEDINGS
Pages:
828-829
Publication date:
1994-01-01
Event title:
52nd Annual Meeting of the Microscopy-Society-of-America/29th Annual Meeting of the Microbeam-Analysis-Society
ISSN:
0424-8201
Source identifiers:
30095
Pubs id:
pubs:30095
UUID:
uuid:2a0464ce-7907-4afe-b6cd-e3f7382020e5
Local pid:
pubs:30095
Deposit date:
2012-12-19

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