Conference item
RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
- Publication status:
- Published
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Authors
Bibliographic Details
- Journal:
- FIFTY-SECOND ANNUAL MEETING - MICROSCOPY SOCIETY OF AMERICA/TWENTY-NINTH ANNUAL MEETING - MICROBEAM ANALYSIS SOCIETY, PROCEEDINGS
- Pages:
- 828-829
- Publication date:
- 1994-01-01
- Event title:
- 52nd Annual Meeting of the Microscopy-Society-of-America/29th Annual Meeting of the Microbeam-Analysis-Society
- ISSN:
-
0424-8201
- Source identifiers:
-
30095
Item Description
- Pubs id:
-
pubs:30095
- UUID:
-
uuid:2a0464ce-7907-4afe-b6cd-e3f7382020e5
- Local pid:
- pubs:30095
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1994
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