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Imaging and Analysis of Axial Heterostructured Silicon Nanowires

Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Volume:
241
Pages:
012088-012088
Publication date:
2010-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
URN:
uuid:28eceaf5-7a97-40d0-b55b-ace205bd4d4b
Source identifiers:
124578
Local pid:
pubs:124578

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