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Atomic and electronic surface structures of dopants in oxides: STM and XPS of Nb- and La-doped SrTiO3(001)

Abstract:

High resolution X-ray photoelectron spectroscopy (XPS) was performed on the (001) surfaces of Nb-doped and La-doped single crystals of SrTiO3. For the Nb-doped samples the XPS results demonstrate that the fraction of Ti3⊃+ ions increases with increasing Nb dopant concentration. The Nb dopants are shown to be in a 5+ ionization state. Atomic resolution scanning tunneling microscopy (STM) images of the 0.7 at.% Nb-doped SrTiO3(001) surface show that Nb-dopant atoms can be imaged on the surface ...

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.83.035410

Authors


Marshall, MSJ More by this author
Newell, DT More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Inorganic Chemistry
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
PHYSICAL REVIEW B
Volume:
83
Issue:
3
Publication date:
2011-01-20
DOI:
EISSN:
1550-235X
ISSN:
1098-0121
URN:
uuid:28de1175-11be-4e66-b50a-bb6d32a13541
Source identifiers:
120341
Local pid:
pubs:120341
Language:
English

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