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Point defects in turbostratic stacked bilayer graphene

Abstract:

The special properties of graphene can be largely influenced by point defects in the lattice. However, TEM studies of topological defects in few-layered graphene have rarely been reported. In this work, the two simplest forms of point defects monovacancy and divacancy in twisted bilayer graphene are characterized using aberration-corrected transmission electron microscopy (AC-TEM) at 80 kV. A convenient approach by using a negative mask in the fast Fourier transform (FFT) has been applied to ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1039/c7nr03879h

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
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Funding agency for:
Gong, C
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Funding agency for:
Warner, JH
Publisher:
Royal Society of Chemistry Publisher's website
Journal:
Nanoscale Journal website
Volume:
9
Issue:
36
Pages:
13725-13730
Publication date:
2017-08-18
Acceptance date:
2017-08-17
DOI:
EISSN:
2040-3372
ISSN:
2040-3364
Pubs id:
pubs:726086
URN:
uri:27843ec7-c90f-4b35-a9f8-b102d26505ef
UUID:
uuid:27843ec7-c90f-4b35-a9f8-b102d26505ef
Local pid:
pubs:726086
Paper number:
36
Language:
English

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