- Abstract:
-
The special properties of graphene can be largely influenced by point defects in the lattice. However, TEM studies of topological defects in few-layered graphene have rarely been reported. In this work, the two simplest forms of point defects monovacancy and divacancy in twisted bilayer graphene are characterized using aberration-corrected transmission electron microscopy (AC-TEM) at 80 kV. A convenient approach by using a negative mask in the fast Fourier transform (FFT) has been applied to ...
Expand abstract - Publication status:
- Published
- Peer review status:
- Peer reviewed
- Version:
- Accepted Manuscript
- Publisher:
- Royal Society of Chemistry Publisher's website
- Journal:
- Nanoscale Journal website
- Volume:
- 9
- Issue:
- 36
- Pages:
- 13725-13730
- Publication date:
- 2017-08-18
- Acceptance date:
- 2017-08-17
- DOI:
- EISSN:
-
2040-3372
- ISSN:
-
2040-3364
- Pubs id:
-
pubs:726086
- URN:
-
uri:27843ec7-c90f-4b35-a9f8-b102d26505ef
- UUID:
-
uuid:27843ec7-c90f-4b35-a9f8-b102d26505ef
- Local pid:
- pubs:726086
- Paper number:
- 36
- Language:
- English
- Copyright holder:
- Gong et al.
- Copyright date:
- 2017
- Notes:
-
This is the accepted manuscript version of the article. The final version is available online from the Royal Society of Chemistry at: https://doi.org/10.1039/c7nr03879h
Journal article
Point defects in turbostratic stacked bilayer graphene
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