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Journal article

Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells

Publication status:
Published

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Publisher copy:
10.1063/1.3610468

Authors


Bennett, SE More by this author
Kappers, MJ More by this author
Barnard, JS More by this author
Humphreys, CJ More by this author
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Journal:
APPLIED PHYSICS LETTERS
Volume:
99
Issue:
2
Pages:
021906-021906
Publication date:
2011-07-11
DOI:
ISSN:
0003-6951
URN:
uuid:259dfeea-f341-4c50-97d9-1eebd9acecc4
Source identifiers:
167652
Local pid:
pubs:167652

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