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Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope

Abstract:

Aberration correction in the transmission electron microscope has led to a reduction in the depth of focus for imaging. The depth of focus in a state-of-the-art scanning transmission electron microscope system, which is currently just a few nanometers, creates an opportunity to explore the three-dimensional structure of a sample by focusing on specific layers, an approach known as optical sectioning. In this article, we review the performance of optical sectioning in the scanning transmission...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ANNUAL REVIEW OF MATERIALS RESEARCH, VOL 42 More from this journal
Volume:
42
Issue:
1
Pages:
125-143
Publication date:
2012-01-01
DOI:
EISSN:
1545-4118
ISSN:
1531-7331
Language:
English
Keywords:
Pubs id:
pubs:344841
UUID:
uuid:24f615f1-628f-4162-9963-1bbf6523d845
Local pid:
pubs:344841
Source identifiers:
344841
Deposit date:
2013-11-17

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