Conference item

Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system

Abstract:: The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional growth/coarsening in the Cu-Co system. Compositional data obtained will be used to measure the width of the precipitate matrix interface and characterize its structure.

Publication status:: Published

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APA Style

Rozdilsky, I., Cerezo, A., & Smith, G. (1998). Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system. 83–90.

MLA Style

Rozdilsky, I., et al. Atomic-Scale Measurement of Composition Profiles near Growing Precipitates in the Cu-Co System. 1998, pp. 83–90.

Chicago Style

Rozdilsky, I, A Cerezo, and G Smith. 1998. “Atomic-Scale Measurement of Composition Profiles near Growing Precipitates in the Cu-Co System.” In , 83–90.
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Authors

+ Rozdilsky, I More by this author

Role:: Author

+ Cerezo, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Smith, G More by this author

Role:: Author

Journal:: SOLIDIFICATION 1998 More from this journal
Pages:: 83-90
Publication date:: 1998-01-01
Event title:: Symposium on Solidification at the 1997 TMS Fall Meeting
ISBN:: 0873393961

Pubs id:: pubs:13516
UUID:: uuid:2401ff52-5d15-4979-afbf-fa5b65735b34
Local pid:: pubs:13516
Source identifiers:: 13516
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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