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Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system

Abstract:
The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional growth/coarsening in the Cu-Co system. Compositional data obtained will be used to measure the width of the precipitate matrix interface and characterize its structure.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
SOLIDIFICATION 1998
Pages:
83-90
Publication date:
1998-01-01
Event title:
Symposium on Solidification at the 1997 TMS Fall Meeting
Source identifiers:
13516
ISBN:
0873393961
Pubs id:
pubs:13516
UUID:
uuid:2401ff52-5d15-4979-afbf-fa5b65735b34
Local pid:
pubs:13516
Deposit date:
2012-12-19

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