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Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system

Abstract:
The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional growth/coarsening in the Cu-Co system. Compositional data obtained will be used to measure the width of the precipitate matrix interface and characterize its structure.
Publication status:
Published

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Authors


Rozdilsky, I More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Smith, GDW More by this author
Pages:
83-90
Publication date:
1998
URN:
uuid:2401ff52-5d15-4979-afbf-fa5b65735b34
Source identifiers:
13516
Local pid:
pubs:13516
ISBN:
0-87339-396-1

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