- The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional growth/coarsening in the Cu-Co system. Compositional data obtained will be used to measure the width of the precipitate matrix interface and characterize its structure.
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Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system
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